Kjemiteknikk

This document specifies the minimum labelling requirements and the mandatory instructions for use for other pyrotechnic articles (except pyrotechnic articles for vehicles, cartridges for powder actuated tools and ignition devices).

This document specifies requirements for the construction and performances of other pyrotechnic articles, except pyrotechnic articles for vehicles, ignition devices and cartridges for powder actuated tools (PAT), of the following generic types: - flares; - flash devices; - gas generators; - heaters; - other cartridges; - pyromechanical devices; - rockets and rocket motors; - semi-finished pyrotechnic articles; - smoke / aerosol generators; - sound emitters; - pyrotechnic liquid dispersers. This document does not apply for articles containing pyrotechnic compositions that include any of the following substances: - arsenic or arsenic compounds; - polychlorobenzenes; - mercury compounds; - lead compounds (except for those included in ignition devices); - white phosphorus; - picrates or picric acid.

This document defines the procedure for categorization of other pyrotechnic articles except pyrotechnic articles for vehicles, ignition devices and cartridges for powder actuated tools (PAT).

This document specifies test methods for other pyrotechnic articles (except pyrotechnic articles for vehicles, cartridges for powder actuated tools and ignition devices).

This document defines various terms relating to the design, construction, performances, labelling and testing of other pyrotechnic articles as defined by Directive 2013/29/EU on the placing on the market of pyrotechnic articles (except pyrotechnic articles for vehicles, cartridges for powder actuated tools and ignition devices).

This document applies to an articulated extraction arm used as a local exhaust device in laboratories and comprised of a capture device (receiving, enclosing or capture hood, nozzle or flat screen) connected to an extraction arm which is articulated ducting to move air from the capture device to discharge. This standard specifies: - a method for type testing; - a method to assess the three-dimensional capture zone of local exhaust devices mounted on an articulated extract arm; - a method for assessing the emission release capture efficiency of local exhaust devices connected to an articulated extract arm and its robustness to a challenge of air disturbance directly in front of and in close proximity to the capture hood and release source; - a method for establishing the reachable, three-dimensional workspace of local exhaust devices mounted on an articulated extract arm by measuring the possible positions of the opening of the device; - a method for measuring the pressure drop and no

This document specifies information to be provided by a manufacturer of explosives for civil uses, or his authorized representative, to the notified body and the user.

<p>This International Standard specifies a method for the quantitative depth profiling of amorphous heavy metal oxide ultrathin films on Si substrates using Medium Energy Ion Scattering (MEIS). Ultrathin films of thickness less than 10 nm can be analysed with MEIS. 100~500 keV H⁺ or He⁺ ions are used for MEIS analysis. Scattered ion energy and angle are measured precisely so that measured MEIS spectra be compared with simulated MEIS spectra. MEIS spectra can be simulated with various programs from free codes such as PowerMeis and SIMNRA in public websites, MEIS expert laboratories, and MEIS manufacturers. Simulation programs calculate scattering cross-sections and electronic stopping powers. Quite often calculated electronic stopping powers are subject to significant errors so that tabulated electronic stopping power values in the IAEA website are recommended to use. If not tabulated, it is recommended to measure electronic stopping power by users for more reliable results. Various types of energy analyzers can be used such as toroidal electrostatic analyser (TEA), magnetic energy analyser (Magnetic), and TOF energy analyser. With MEIS analysis procedures specified in this standard, less than 10 % uncertainty can be expected for ultrathin films under the guidelines describe in this standard. This standard is written for amorphous or polycrystalline thin films but not for crystalline thin films. To improve the uncertainly of MEIS analysis more, additional standards for calibration of scattering geometry, ion energy, energy resolution, detector efficiency, sample alignment, and etc. are required.</p>